© Corner analysis with statictical data example 1
ANKASYS DAP is a unique Software, which enables you to work on STDF ( Standard Test Data Format) files and perform yield analysis.
ANKASYS DAP Details
STDF is a comprehensive standard for the entire ATE industry. STDF is flexible enough to meet the needs of the different testers that generate raw test data coming from ATE. Data analysis programs use STDF (binary file) to extract desired information.
ANKASYS DAP enables test and product engineers to perform fast yield analysis and process characterisation on their desktops by making use of use of STDF files directly. ATE generates the STDF file and ANKASYS DAP opens it and analyses the result, no need to wait for data to be inserted into database. ANKASYS DAP is particularly useful for test engineers close to ATE system.
Distribution plots. Box plots. Parametric test wafer map. Pareto fails charts. Detailed global information : tester, lot, operator etc.
Test names, limits, fail counts, min, max, range, mean, sigma, cpk etc. Yield information, good parts, failing parts, parts retested. User-friendly copy and paste functionality.
© Corner analysis with statictical data example 2
© Box plot and distribution example 1
© Box plot and distribution example 2
© Parametric wafer map example
© A sample video showing ANKASYS DAP capabilities